Graphene and Scanning Electron Microscopy
Today’s entry is devoted to one of the most basic techniques for characterizing of manifold materials, including graphene and its derivatives – Scanning Electron Microscopy (SEM). Scanning electron microscopy allows to visualize morphological features of conductive materials and in case of G-Flake® products, it allows to indicate one of its most important parameters, determining final properties … Czytaj dalej Graphene and Scanning Electron Microscopy
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